Energy from different natural sources (light, wind, thermal, etc.) can be converted into measurable electrical quantities via a series of physical phenomena, some of which are at the basis of modern-day technologies. Among devices where energy conversion

In a conventional planar silicon field effect transistor (FET), the gate controllability becomes weaker when its lateral dimension becomes smaller than the transistor thickness, which results in adverse short-channel effects, including leakage current, sa

Professor Yuanyuan Shi is a researcher in the field of nanoscience and nanotechnology, known for her groundbreaking contributions to the development of novel nanoelectronic devices. Currently serving as a professor at the University of Science and Technol

The understanding of electrical properties in materials is a growing concern in materials research and the semiconductor industry. To address the limitations of current methods, new and existing technologies are being adapted. This technical note introduc

Park Systems announced that it is embarking on an exciting phase of expansion. The company broke ground on its new Gwacheon headquarters on September 15, 2023, to continue its growth expanding global footprint in the coming years.

Park Systems, a global leader in atomic force microscopy (AFM) and nanoscale metrology solutions, is thrilled to announce its distinguished inclusion in Forbes Asia's

Park Systems announces Stefan Schneider as the new General Manager of Park Systems Accurion Division (Park Systems GmbH), a prominent provider of imaging spectroscopic ellipsometry (ISE) and active vibration isolation (AVI) systems. Schneider brings over

Park Systems celebrated the grand opening of its new application center in Shanghai, China. The opening ceremony was held at the WE International in Shanghai, successfully witnessing the new chapter of Park Systems Shanghai Application center on May 15.

Atomic force microscopy (AFM) is a nano-scale microscopy technology that employs a sharp cantilever featuring a probe tip with a width less than 10 nm. By gauging the displacement of this cantilever, AFM detects atomic forces – both attraction and repulsi

Professor Ranjith Ramadurai, a leading nanotechnology expert, has dedicated over two decades to teaching and researching at the Indian Institute of Technology Hyderabad (IITH). His work encompasses atomic force microscopy (AFM), nanoscale characterization