Volume 30 | 21 May 2026
NANOscientific Magazine
Four decades ago, a landmark paper changed how we see matter at the nanoscale. Vol. 30 of NANOscientific Magazine honors the 40th anniversary of AFM with research, reflections, and breakthroughs from the scientists who built the field — and those defining what comes next.
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From Non-Contact AFM to Functional Nanoscopy Expanding the Capabilities of Scanning Probe Microscopy
Over the past four decades, atomic force microscopy has evolved from a surface imaging tool into a versatile platform for nanoscale characterization. Beyond topography, AFM now enables measurement of electrical, magnetic, thermal, and optical properties with high spatial resolution.
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From Laboratory Curiosity to Industrial Infrastructure
Volume 30 | 21 May 2026
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Interview with John Foster on Calvin Quate and the Birth of AFM
Volume 30 | 21 May 2026
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Active AFM Cantilevers And The New Research They Enable
Volume 30 | 21 May 2026
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Nanoscale Dynamic Mechanical Analysis with AFM
Volume 30 | 21 May 2026
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