Since the invention of devices like the surface force apparatus in 1969[1]and the atomic force microscope(AFM) in 1986[2], surface forces have been studied extensively by many scientists[3] as properties of the interfacial region are of great interest for

Nanoscale frictional measurement, or nanotribology, is an effective approach to identify surface compositional differences for a wide variety of materials, including polymer blends, thin films and semiconductors. Lateral Force Microscopy (LFM), a derivati

Flexible, biocompatible electronic materials and semiconductors are wanted to create a novel generation of bioelectronic interfaces.

Since the inception of scanning tunneling microscopy (STM), electrochemists have sought to take advantage of scanned probe microscopy (SPM) techniques to manipulate the spatial position of a probe with high resolution to facilitate simultaneous high resol

Group K- Dr. Bloom studies Particle Astrophysics with emphasis on the measurement of phenomena associated with regions of high field gravity.