NanoScientific Magazine, Fall 2014 | NANOscientific

Volume 2 | 30 Sep 2014

NanoScientific Magazine, Fall 2014

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Park Systems Unveils New Park XE15: Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample™ scan.

Electrical & Electronics

Three-Dimensional Atomic Force Microscopy: Changing the Future of Nanometrology for the Semiconductor Industry

he Three-Dimensional Atomic Force Microscopy (3D AFM) by Park Systems is an innovative and cost effective means of accurately characterizing the roughness and the sidewall morphology of photoresist semiconductors and was created by industry’s need for a n

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