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Keynote Talk

Dr. Puvaneswaran Chelvanathan

The National University of Malaysia, Malaysia

E-mail

cpuvaneswaran@ukm.edu.my

AFM-Driven Layer-by-Layer Nanoscale Functional Mapping in CZTSSe Thin-Film Solar Cells

Atomic Force Microscopy (AFM) offers powerful nanoscale insights into the functional behavior of individual layers and interfaces in kesterite (CZTSSe) thin-film solar cells. This keynote emphasizes the role of AFM in layer-by-layer functional mapping of molybdenum (Mo), oxidized Mo (MoO _x ), and the CZTSSe absorber. For Mo back contacts, AFM topography and Kelvin Probe Force Microscopy (KPFM) highlight the effect of post-deposition treatments. Vacuum annealing enhances the Mo work function to ~5.05 eV while reducing surface roughness, improving charge transport across the Mo/CZTSSe interface. Conversely, prolonged ambient exposure leads to native MoOx formation. Conductive AFM (C-AFM) reveals significant conductivity losses and heterogeneous grain structures in oxidized films, underlining storage and handling challenges. At the absorber level, AFM functional mapping shows enhanced surface morphology and electronic uniformity of CZTSSe grown on optimized Mo contacts. KPFM mapping identify improvements in grain boundary potential and crystallinity, particularly with sodium-assisted diffusion during annealing. Together, these results demonstrate AFM's indispensable role as a multifunctional diagnostic tool, correlating topography, conductivity, and electronic potential across device layers.

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